Particle measurement: Analyzing particles with different measurement technologies

There are a number of different particle measurement solutions. All of them have their strengths and weaknesses for different industries and various applications. There are also different methods for detection as well as a number of mathematical and physical models used to calculate particle parameters. A DLS (dynamic light scattering) signal, for example, can be interpreted by PCS, by PCCS or by FPS. Each particle measurement technology aims to analyze particles in a sample and gather data to allow a deeper understanding of the particle populations. Particle sizes, particle size distributions, particle concentrations and also the shape of particles can be measured. Depending on the particle measurement system, you can analyze suspensions, powders, granulates or bulk materials, but these methods also have strong limitations. When measuring non-spherical particles the measurement results are divergent, for example. Dynamic light scattering, nanoparticle tracking analysis, laser diffraction, dynamic and static image analysis, sieve analysis as well as TEM and SEM are some of the most established methods for particle measurement. Our patented OF2i method is specialized in characterizing nanoparticles. This new method will revolutionize the market of particle measurement instruments.