All about particle analysis.
Particles and nanoparticles can be analyzed in various ways. In our Knowledge Base you can find an overview of established methods, more detailed articles and information about other topics of interest in the field of particle measurement. We will update this Knowledge Base regularly.
There are a number of different particle measurement solutions. All of them have their strengths and weaknesses for different industries and various applications. There are also different methods for detection as well as a number of mathematical and physical models used to calculate particle parameters. A DLS (dynamic light scattering) signal, for example, can be interpreted by PCS, by PCCS or by FPS. Each particle measurement technology aims to analyze particles in a sample and gather data to allow a deeper understanding of the particle populations. Particle sizes, particle size distributions, particle concentrations and also the shape of particles can be measured. Depending on the particle measurement system, you can analyze suspensions, powders, granulates or bulk materials, but these methods also have strong limitations. When measuring non-spherical particles the measurement results are divergent, for example. Dynamic light scattering, nanoparticle tracking analysis, laser diffraction, dynamic and static image analysis, sieve analysis as well as TEM and SEM are some of the most established methods for particle measurement. Our patented OF2i method is specialized in characterizing nanoparticles. This new method will revolutionize the market of particle measurement instruments.
OptoFluidic Force Induction (OF2i)
The OptoFluidic Force Induction is a completely new method for the characterization of nanoparticles and is not limited by relying on measuring Brownian motion. Learn more about why OF2i is ahead of Brownian-motion-based methods for particle characterization and how our patented method can revolutionize your research as well as your production.
Dynamic Light Scattering
Dynamic light scattering measures the random movement of particles is well-established for particle analysis in the laboratory.
Nanoparticle Tracking Analysis
As an established method for particle counting, NTA analyzes the speed of movement from single particles using a microscope.
Laser diffraction is well known for its unmatched versatility and is used to determine particle size distributions (PSD) of both liquid and powder samples.
TEM und SEM
Electron microscopes are highly versatile and powerful tools. They provide extremely high spatial resolution when measuring particles.
By characterizing particles we can gather uesful data about materials, undertake research and optimize production processes.
Process Analytical Technology
A PAT allows better design, analysis and control of e.g. pharmaceutical manufacturing processes by analyzing various parameters.